JEOL JEM-2100F Transmission Electron Microscope by voelckerlab · June 22, 2014 We have just commissioned a new JEOL JEM-2100F Transmission Electron Microscope (TEM) with a field emission electron source for analyses at the atomic/molecule level in materials science, nanotechnology and life science. Share
New paper in ACS Applied Materials & Interfaces on lanthanide luminescence enhancement September 15, 2014